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部落格 ATP的官方部落格提供關工業級記憶體和嵌入式儲存技術當前與新興趨勢的普及知識、新聞和意見的資源庫。關於我們 我們透過高效能且耐用的NAND快閃記憶體產品和DRAM記憶體模組，持續改變工業和企業運用的面貌。
For over 30 years, ATP is the leading provider of Specialized Storage and Memory solutions products for industrial applications.
2021年6月29日 · Reliability Demonstration Test (RDT) is a rigorous test performed on ATP solid state drives (SSDs) over extended periods of time to demonstrate that each SSD meets the strictest quality requirements. All testing parameters aim to validate the mean time between failures (MTBF) rating of the drive.
2023年8月7日 · Error Correction Code (ECC) is one of most common ways of protecting data integrity by handling memory errors such as bit-flipping caused by cosmic rays or thermal challenges. ECC memory typically detects double-bit errors and corrects single-bit errors that can occur while data is being transmitted between the controller and the memory.
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Mar 6, 2021, 7:51 AM Recognition that ATP ELECTRONICS TAIWAN INC. KAOHSIUNG BRANCH 2F., No.16-2, Neihuan S. Rd., Nantze Export Processing Zone, Nanzi Dist ...
2018年10月25日 · The Bathtub Curve shows the three periods of product failure. Test During Burn-in (TDBI) at mass production level detects early life failures (ELF) and effectively screens out weak ICs that could fail during the early product life. The ATP TDBI system applies extreme high/low temperature, high-low voltage, and pattern testing on DRAM modules.
