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  1. QIII Surface Particle Detection – Pentagon Technologies. Redefine productivity. Pentagon Technologies' line of surface particle detectors are the standard in high technology industries for measuring and controlling surface contamination. Particles that accumulate on critical surfaces or products can reduce yield and reliability. To.

  2. 產品特色. QIII為世界專利,採接觸式、量測物體表面Particle數量的設備! 半導體,面板廠,設備商與所有PARTS CLEAN廠商,驗證PARTS表面是否乾淨的檢驗標準工具! 瀏覽更多內容. 規格說明. 粒子量測範圍:0.1um - 5um. 通道:0.1、0.2、0.3、1.0、3.0、5.0um. 傳感器:雷射二極管. 顯示螢幕:7 英寸 WVGA,觸控螢幕,帶有縮放功能. 數據輸出:USB 端口、乙太網路、WiFi (選配) 語言:英文、中文、日文、韓文. 尺寸和重量:寬12英寸X 深12英寸X 高9英寸,26.5 磅. 輸入電源:100-240 VAC,50/60 赫茲. 電池:2顆 鋰電池,可熱插拔. 售後服務.

  3. QIII SM™ SURFACE PARTICLE DETECTOR 0.3-10um Redefine productivity. Pentagon Technologies' line of surface particle detectors are the standard in high technology industries for measuring and controlling surface contamination. Particles that accumulate on critical surfaces or products can reduce yield and reliability.

  4. QIII UltraTM. SURFACE PARTICLE DETECTOR. FIRST TIME PM RECOVERY. How do you measure cleanliness of the process chamber during a PM? Pentagon Tech-nologies’ QIII SPD can dramatically reduce PM recovery time, green-to-green time, and increase the overall throughput of a fab.

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  5. 產品圖片. 相關產品. QIII+ or Q3+ Pentagon 美國, 表面微粒密度驗證表面微粒子密度分析儀 (表面清潔驗證)及產品資料 表面微粒子密度分析計數器 美國 Pentagon QIII max (0.3um) and QIII Ultra (0.1miron) 物體表面微粒子計數器產品目錄,對於做為表面微粒子檢測來說是必須的驗証工具且能夠使貴公司的客戶認可. 供您參考.我們是美國 Pentagon 中國區.

  6. Specification. • Particle sensitivity range: 5um - 125um. • Channels: 5, 10, 25, 50, 100, 125um. • Sensor: Laser Diode. • Size & Weight: 12” W X 10.5” D X 9” H, 18.5 lbs. • Batteries: (2) Lithium Ion, hot swappable. • Display: 7” WVGA, sealed touch screen interface with pinch zoom. • Data Units: Particle Density and Raw counts.

  7. 2024年5月14日 · Pentagon Technologies’ QIII+® can dramatically reduce PM recovery time, green-to-green time, and increase the overall throughput of the fab. Using the QIII+®, you can immediately detect particles to 0.3 micron and localize them within a production tool.